【推荐原文】Design of CMOS Circuits for Stuck-Open Fault Testability
Design of CMOS Circuits for Stuck-Open Fault Testability作者：A.P. Jayasumana and Y.K. Malaiya and R. Rajsuman
原文地址：http://www.cs.colostate.edu/~malaiya/p/rajsuman91.pdf 确定是软件测试文章？
页:
[1]
