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标题: 【推荐原文】CMOS Stuck-open Fault Testability [打印本页]

作者: namisang    时间: 2009-1-15 14:13
标题: 【推荐原文】CMOS Stuck-open Fault Testability
CMOS Open-Fault Detection in the Presence of Glitches and Timing Skews
作者: Y.K. Malaiya and A.P. Jayasumana
原文地址:http://www.cs.colostate.edu/~malaiya/p/rajsumancmos89.pdf




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